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Reflection prefix PO-15 V

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Reflection prefix PO-15 V
Manufacturer:
SIMEKS
Location:
Novosibirsk
Applying:
Other:
Designed for the study of various types of solid samples, including optical and semiconductor materials, precious stones and other objects of arbitrary shape
• The sample is located on the subject plane of the investigated surface downwards, the angle of incidence of the central beam on the sample is 15 °
• Allows you to examine samples of small sizes (the diameter of the test area is from 1 mm)
• The set-top box is equipped with a set of replaceable diaphragm holders for samples of different sizes
• When using a mini-press, it allows you to examine samples in the form of a thin layer rolled out on a mirror plate made of alloy steel (radiation passes through the substance layer twice, reflecting from the mirror surface)
• Not used: for the study of bulk and liquid substances