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Spectrometer SPECTROSCAN MAX-GVM

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Spectrometer SPECTROSCAN MAX-GVM
Manufacturer:
NPO Spektron
Location:
Saint Petersburg
The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters.

The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity.

Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.