RAM-30μ X-ray analytical microprobe-microscope by Scientific Instruments

The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task. Designed for the analysis of almost any type of environmental samples – water, soil, precipitation. Quick switching to work. It does not require a long warm-up. Low argon consumption. Easy to use.

Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).

Atomic Emission Complex "Grand Globula" includes a spectrometer "Grand", a spectroanalytic generator "Ball Lightning" and a tripod "Globula". It allows the analysis of various substances and materials in arc and spark discharges in air, for example according to GOST 17818.15-90 "Graphite. Spectral analysis method", GOST 9717.1-82 "Copper. A method of spectral analysis based on metallic standard samples with photoelectric spectrum registration" and other MVIS.

At the Scientific Research Center of the Russian Academy of Sciences, the technology of acousto-optic filtration of optical radiation is used to create a wide class of optical devices that are successfully used, for example, in biomedicine to diagnose various diseases (including oncology), in agriculture to diagnose the condition of plants, during non-destructive testing of complex technical objects and in solving other tasks. Acousto-optics has a number of important advantages over other technologies for obtaining spectral information: - the ability to create imaging devices without spatial scanning, since the acousto-optic filter is a software-controlled tunable light filter; - the compact modular design allows the acousto-optic filter to be integrated into the optical circuit of most imaging devices, which expands their analytical capabilities; - spectrum scanning is carried out by means of an electrical signal, without mechanical scanning; - fast arbitrary spectral addressing causes high shooting speed and the absence of redundant information; - software management. The key element of the presented device – an acousto–optic filter - is being developed at the Scientific Research Center of the UP RAS on the basis of original calculation methods. The manufacture of acousto-optic filters, optical and mechanical components, as well as the assembly, tuning, and calibration of such devices is also carried out at the Scientific Research Center of the UP RAS.

The MS-1104E spectrometer is characterized by high performance and accuracy of Mössbauer measurements achieved through the use of “compressed” geometry, as well as the use of highly efficient and selective resonant scintillation detection units that improve the energy resolution of resonance absorption lines by up to 30%. The technique of software and hardware stabilization of the spectrometric path developed and used in the spectrometer allows for long-term Mossbauer measurements without manual adjustment. The method of modulation in the specified speed intervals can significantly increase the sensitivity and expressiveness of measurements and reduce the time to determine the magnitude of the effects of resonant absorption by tens of times in the study of temperature phase transitions with a low concentration of resonant elements. The electronic components of the spectrometer are developed on the basis of a modern element base using programmable logic matrices and microprocessors. Adjustable spectrometric paths and high-voltage power supplies of the PMU are integrated into detection units, modulator driver modules and multi-channel storage are made in the ISA standard and are located in the processor unit of the computer. Setting and monitoring of all parameters of the spectrometer and processing of the measured spectra is carried out from the operating windows of the control and processing programs. Since 2000, more than ten spectrometers of this type have been supplied to leading scientific organizations in Russia and neighboring countries. One of the few industrial applications of Mössbauer spectroscopy should be noted - the development and supply to the Volgodonsk NPP of certified MS-1104Em methods and spectrometer for monitoring corrosion processes in the heat exchange circuits of the VVER-1000 reactor.

Devices of a new generation, automated stations of continuous radiation monitoring Zastava-1 are designed to organize continuous effective monitoring of the radiation situation and notification of radiation hazards. The stations have up to three independent measurement channels, which allows monitoring simultaneously in several zones. The stations support remote monitoring - they have a connection to a local computer network, Internet access.

The ultimate display quality is ensured by the use of built-in acoustic and vibration isolation, thermal stabilization, the industry's best sensitivity of the optical recording system and the unique design of the scanning probe system, which allows achieving atomic resolution in routine measurements. In the basic configuration, 50+ AFM techniques are available, including the HybriD method, which allows conducting all cutting-edge nanomechanical, electrical and magnetic studies. Intelligent ScanTronic™ algorithm for one-click optimization of scanning parameters, which allows for perfect relief measurements using the amplitude-modulation method, regardless of the operator's experience. Automated examination of multiple samples using a simple user interface to create a point-by-point scanning scenario and a database for stored received images. Control of samples with dimensions up to 200×200 mm and thickness up to 40 mm at any point of the surface with a positioning accuracy of 1 micron. Wide customization possibilities: installation of additional optical equipment, development of specialized sample holders, combination with a transport system, automation of measurements and data analysis in accordance with customer requirements.

NTEGRA Spectra II is already a second-generation measuring system that successfully demonstrates the unification of two worlds: AFM and Raman spectroscopy. It can perform multiple functions ranging from relief mapping to 2D spectral analysis, from studies of electrical and mechanical properties to optical measurements with a resolution below the diffraction limit. Now scientists can conduct a complete physico-chemical analysis of the surface properties of the sample at a time. As a result, researchers get unlimited opportunities to develop their laboratory techniques.

MAES analyzers for recording atomic emission spectra with a time resolution of 1 ms are based on highly sensitive photodiodes and a special switching board for simultaneous reading of several sections of the spectra. The assembly of the rulers is installed on the "Grand" spectrometer. A " Flow" or twin-jet arc plasmatron is used to excite the atomic emission spectra of powder samples. The ATOM software registers the selected spectral lines and provides their processing according to the specified algorithms, taking into account the number and brightness of flashes (i.e. particle size). Recording the spectra of powder samples with a large time resolution makes it possible to estimate the number and size of individual particles, identify their composition and determine the concentrations of elements in each particle, promptly assess the uniformity of the distribution of certain elements to be determined and expand the possibilities of spectral analysis without significant changes in sample preparation. Main application areas: mass analysis of powder geological samples by scintillation to determine gold, silver, platinum group metals, iridium, rhodium, etc. with detection limits up to 0.01 g/t; qualitative determination of the composition of inclusions and mineral particles.

The analyzer is designed to determine the mass fraction of sulfur in automotive fuel in accordance with GOST R 52660-2006 / GOST ISO 20884-2016, ASTM D6334, as well as in oil and petroleum products according to GOST R 53203-2008 / GOST 33194-2014, ASTM D2622, GB/T 11140-2008. Depending on the customer's needs, the analyzer is configured to work in accordance with a particular standard. Implements an arbitration method for measuring the mass fraction of sulfur in automobile fuel of the third, fourth and fifth classes. The device is designed specifically for high-quality and fast X-ray fluorescence analysis of fuel in accordance with the technical regulations "On requirements for automotive and aviation gasoline, diesel and marine fuel, jet fuel and heating oil", which establishes an arbitration X-ray fluorescence wave dispersion method for determining the mass fraction of sulfur in automotive fuels of the third, fourth and fifth classes. The wave dispersion sulfur analyzer SPECTROSCAN SW-D3 is designed taking into account all the requirements for the process of X-ray fluorescence elemental analysis of low sulfur contents in petroleum products. The operator's actions when performing measurements are minimized: - the number/name of the sample is entered from the built-in keyboard; - the sample is poured into two cuvettes; - the obtained samples are placed in the analyzer and measurements are started. The analyzer performs all subsequent actions automatically without operator involvement: - calculates and displays the sulfur content in the sample; - calculates convergence - the difference in determining the mass fraction of sulfur in the first and second samples; - prints measurement results on the built-in printer.

The device is designed to analyze the phase composition and structural state of polycrystalline objects of various origins.

The multifunctional X-ray diffractometer DRON-8 (8H) with a vertical theta goniometer and the horizontal position of the sample allows X-ray diffraction analysis of the phase composition, structural state and orientation of a wide range of objects of various shapes and sizes.

The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

14 high-precision stepper motors control all moving parts of the microscope, and intelligent software blurs the line between optical and SPM imaging. NEXT provides continuous magnification from millimeter-scale panoramic optical images to atomic resolution, and intermediate operations such as laser pointing to the cantilever, sample positioning, soft approach and configuration of advanced SPM techniques occur automatically.

Specialized wavelength-dispersive XRF analyzer based on the Cochois scheme is designed for high-precision determination of chemical elements U, Th, Mo, Au, W, Tl, As, Pb as well as other elements in ores, rocks and when developing the technogenic fields. Possibility to determine groups of elements without readjustment of crystal-analyzer. Exceptionally high resolution of the Koshua X-ray optical scheme with crystal-analyzer quartz 1011. Developed mathematical support. Principle of analyzer operation is based on the excitation of the fluorescent radiation of sample atoms being under examination by radiation coming from an X-ray tube. Spectrum decomposition of the fluorescence radiation is performed according to Cauchois method. The fluorescence radiation focused by analyzing crystal and standard line are marked on Rowland focal circle. Then, they are recorded by X-ray radiation detector in turn. The intensity of the fluorescent irradiation with a particular wavelength is directly proportional to the chemical element concentration in the material under examination.

The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.