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NTEGRA Spectra II is already a second-generation measuring system that successfully demonstrates the unification of two worlds: AFM and Raman spectroscopy. It can perform multiple functions ranging from relief mapping to 2D spectral analysis, from studies of electrical and mechanical properties to optical measurements with a resolution below the diffraction limit. Now scientists can conduct a complete physico-chemical analysis of the surface properties of the sample at a time. As a result, researchers get unlimited opportunities to develop their laboratory techniques.

NT-MDT Spectrum Instruments is an INTEGRA Nano IR–scattering scanning near‑field optical microscope (s-NSOM) designed for the infrared spectral range. The AFM probe is located in the focus of an optical system that directs the IR laser radiation to the sample and collects the optical response. The collected radiation is sent to the Michelson interferometer for optical analysis. The far-field component of the collected signal is suppressed by synchronous detection. The INTEGRA Nano IR system allows detecting the amplitude and phase of the near-field signal. The spatial resolution of the resulting reflection and absorption contrasts is approximately 10 nm and is determined only by the size of the tip of the probe.