Metrology

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525 products
Transportable hydrogen quantum clock PKCHV-M "SAPPHIRE"
Transportable hydrogen quantum clock PKCHV-M "SAPPHIRE"
Designed for: comparisons of time scales of geographically separated objects; time scale formation and storage; formation of highly stable signals with frequencies of 5 MHz, 10 MHz, 100 MHz; measurement of the difference in time scales of spatially spaced time standards located at a distance of up to 1000 km with an error of no more than 2 ns; measuring the frequency of reference signals of remote standards, as well as determining the parameters of instability of their frequencies and spectral characteristics of signals; time scale storage and a source of a reference highly stable signal on mobile and stationary objects.
VNIIFTRI
Mendeleevo
Produced in: Mendeleevo, Moscow region
MAESTRO-αMS gas chromatograph by Interlab
MAESTRO-αMS gas chromatograph by Interlab
We offer expert laboratories of physicochemical methods of analysis a gas chromatograph with a quadrupole mass spectrometric detector «MAESTRO-αMS». Quadrupole GC-MS «MAESTRO-αMS» is in demand for targeted research (screening) and non-targeted search. In targeted studies, it is necessary to detect given target compounds in samples of various nature and origin at the level of residual amounts, for example, several picograms of the target compound in the injected 1 μl of liquid sample. Most often, targeted research is carried out in the following areas of laboratory screening: ecology, food safety, clinical monitoring, narcology, doping control, production control of various raw materials. In targeted studies, it is often required not only to confirm the presence of a compound in a sample, but also to determine the level of its content quantitatively, since both the list of target compounds and the permissible level of their presence in the sample are specified by regulatory documents. Quantitative analysis requires standards for the substances you are looking for. When conducting a non-target search, as a rule, it is required to analyze a sample of unknown composition, in other words, to find as many compounds as possible in the sample and identify (identify) each of them. Since the identification of a detected compound is carried out by comparing its experimental mass spectrum with the spectrum of a pure substance obtained under standard conditions, this task requires reference libraries of mass spectra of pure substances, as well as tools for working with mass spectra, for example: algorithms for cleaning experimental mass spectra from background and spectral noise (mass spectrum deconvolution algorithms), library search and comparison algorithms. An off-target search is called a qualitative analysis, since the researcher is primarily interested in the list of detected substances, and not in the quantitative assessment of their content in the sample. When creating MAESTRO-αMS, we took into account our own many years of experience in operating imported analogues. We have made the device inexpensive. We have made the device compact: The modern design of the device made it possible to make the MAESTRO-αMS really compact, so that the device occupies the smallest possible area on the laboratory table. The layout of the device allows you to remove the ion source on the front flange for cleaning and replacing the cathodes, if necessary. We have reduced the cost of operation: When developing the MAESTRO-αMS, we sought to increase the resistance of the device to sample matrices and use a minimum of consumable materials in order to eliminate downtime for maintenance and replacement. As a result, we have created an extremely stable ion source and a perpetual photomultiplier detector. We have created special software: Even at the first acquaintance with the software, it becomes obvious that being in the window of each button and each parameter to be changed is expedient and logical. Our software product was created for the convenience of the operator, so we implemented the necessary and eliminated the unnecessary. We used the principle of one active window, in which the operator moves sequentially step by step, performing hardware settings, setting the data collection method, subsequent processing algorithms, templates for presenting the results. MAESTRO-αMS offers a wide range of scanning modes, built-in algorithms for working with mass spectral data, convenient unloading of initial data arrays for their processing in specialized software packages, graphics export for presentations and scientific publications. You can use several libraries of mass spectra at the same time, or create your own for your typical tasks. Finally, we provide a 5-day training course for professionals who want to understand the theoretical foundations of the method and their implementation in the hardware of modern quadrupole GC/MS. The volume and depth of presentation of the material from the developers of the device is intended to lay the foundation for the effective use of «MAESTRO-αMS» in the future. Some technical characteristics of MAESTRO-αMS: • Instrumental detection limit (SIM, OFN @272 m/z ) < 10 fg; • Scan modes: scan for selected ions, full scan in a given mass range, combined scan mode; • The number of simultaneously connected libraries of mass spectra is at least 10.
Produced in: Moscow
Anemometer ACC-3PM
Anemometer ACC-3PM
from 22 218 ₽
Designed to perform two functions: - measurements of the air flow rate (wind); - alarm when the measured parameter exceeds the set value.
Tantal
Vladimir
Produced in: Vladimir
Anemometer ACC-3PP
Anemometer ACC-3PP
from 20 688 ₽
Designed to perform two functions: - measurements of the air flow rate (wind); - alarm when the measured parameter exceeds the set value.
Tantal
Vladimir
Produced in: Vladimir
KOIDZ-VD Sets of samples of artificial defects and gaps
KOIDZ-VD Sets of samples of artificial defects and gaps
from 0 ₽
KOIDZ-VD kits consist of samples of artificial defects (SAD) and samples of gaps (SG). Samples of artificial defects are made in the form of flat and curved plates and cylinders, on the working surfaces of which defects are made in the form of continuity violations like slits of various depths, opening widths and lengths. The working surfaces of flat SADs are two opposite surfaces on which longitudinal slits are cut by an electroerosion method The working surfaces of the SAD, reproducing a positive curved surface, are samples with a cylindrical surface. The working surface of the SAD reproducing negative curvature is the inner surface of the curved plate — the place of inflection. The KOIDZ-VD kit contains an SAD for determining the influence of various quantities. To determine the effect of the roughness of the working surfaces, the kit contains SADs with different roughness, on which defects of the same depth are made. To determine the effect of positive curvature and surface roughness, the kit contains cylindrical samples with different roughness of working surfaces on which defects of the same depth are made. To determine the simultaneous effect of negative curvature and surface roughness, the kit contains curved plates on which two defects of the same depth are cut, one of which is located on the flat, the other on the curved parts of the sample. To determine the effect of the chemical composition of the material of the controlled products, the kit contains samples of steel 10, steel 20 and steel 45. The same defects are made on each sample. To account for the influence of specific electrical conductivity, the kit contains samples from non-magnetic structural materials: aluminum alloy D16T and titanium alloy VT-23. The same defects are made on each sample. Gap samples are flat and curved plates of different thicknesses made of dielectric material. Technical specifications The range of nominal values of the depth of defects, mm: from 0.1 to 10. The limits of permissible error of the value of the depth of defects, mm: from ± 0.02 to ± 0.25. The range of nominal values of the width of the opening of defects, mm: from 0.03 to 0.15. The limits of the permissible error of the width of the opening of defects, mm: from ± 0.01 to ± 0.05. The range of nominal values of the length of defects, mm: from 6 to 100. The limits of permissible error of the value of the length of defects, mm: from ± 0.5 to ± 1. The range of nominal values of the thickness of the dielectric gap samples, mm: from 0.2 to 10. The limits of the permissible error of the thickness of the samples, mm: from ± 0.02 to ± 0.5. The range of nominal values of the radius of curvature of curved surfaces with defects, mm: - convex: from 13 to 510; - concave: 10.
Produced in: Moscow
AS-3 Areometer-saccharometer by Chimlabpribor
AS-3 Areometer-saccharometer by Chimlabpribor
from 1 224.12 ₽
Designed to measure the concentration of sugar in sugar-containing solutions by weight of dry matter. Hydrometers are manufactured in accordance with GOST 18481-81.
Produced in: Wedge, Moscow region