Device for preparation of metal samples

The X-ray diffractometer DRON–8T is the flagship model of the line of stationary X-ray diffractometers of JSC IC Burevestnik. It is equipped with a high-precision wide-angle vertical goniometer with an angular reproducibility of 0.0001° and is designed mainly for the study of highly perfect crystalline objects (single crystals, epitaxial films) in high-resolution geometry.

The device is designed to analyze the phase composition and structural state of polycrystalline objects of various origins.

The multifunctional X-ray diffractometer DRON-8 (8H) with a vertical theta goniometer and the horizontal position of the sample allows X-ray diffraction analysis of the phase composition, structural state and orientation of a wide range of objects of various shapes and sizes.

The spectrometer was created according to the Cherni-Turner scheme based on a flat diffraction grating and an MAES analyzer with one line of photodetectors. It has increased photometric accuracy due to cooling and temperature stabilization of the photodetector range, as well as due to its shell-less design, in which there is no re-reflection of radiation on the cover glass and the background level in the recorded spectrum decreases. The optical scheme and design of the spectrometer are optimized to obtain a high-quality spectrum with a low level of background radiation in any of the regions lying in the spectral range of 190-1100 nm. The choice of the working area is carried out by changing and rotating the diffraction gratings. The sealed case of the spectrometer is filled with an inert gas. The radiation is injected into the spectrometer using a quartz capacitor or a fiber-optic cable with an SMA-905 connector. The optical scheme and design of the spectrometer are protected by patents.

The spectrometer is designed to measure the intensities of analytical lines of chemical elements and, by recalculating them, determine the mass concentration of elements from P(15) to U(92) contained in the analyzed sample. The process of analysis from a set of data and their processing to obtaining results in the form of a table of concentrations of the elements being determined is automated and performed using a personal computer. The spectrometer can be used in various fields of science and technology (ecology, biology, medicine, agriculture, food industry, geology, mining, geophysics, sanitary and epidemiological control, etc.).

The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

The spectrometer is designed to perform quantitative and qualitative spectral analysis of various substances and materials (powders, metals, solutions) in factory and research laboratories. The spectrometer is compact due to the vertical arrangement of the Paschen-Runge optical system. It consists of two MAES analyzers with 10 lines of photodiodes installed on a circle with a radius of 520 mm, a non-classical concave diffraction grating, a special table with a built-in computer and a spectrum excitation source.

Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).

The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area. The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined. With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.

Designed for comprehensive studies of the physical properties of the surface using classical optical microscopy, confocal laser microscopy, confocal spectroscopy and scanning probe microscopy (atomic force microscopy). It allows you to get full spectra of Raman (Raman or Raman) scattering and/or fluorescence, confocal laser and confocal spectral images (surface mapping), SPM (AFM) images. The design of the Centaur I complex allows the use of both separate methods (for example, confocal microscopy / spectroscopy) and the combination of methods (including the combination of scanning fields, AFM / Raman studies, etc.).

The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

Atomic Emission Complex "Grand Globula" includes a spectrometer "Grand", a spectroanalytic generator "Ball Lightning" and a tripod "Globula". It allows the analysis of various substances and materials in arc and spark discharges in air, for example according to GOST 17818.15-90 "Graphite. Spectral analysis method", GOST 9717.1-82 "Copper. A method of spectral analysis based on metallic standard samples with photoelectric spectrum registration" and other MVIS.

Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).

The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task. Designed for the analysis of almost any type of environmental samples – water, soil, precipitation. Quick switching to work. It does not require a long warm-up. Low argon consumption. Easy to use.