Atomic emission spectrometer Iskroline 500

The spectrometer was created according to the Cherni-Turner scheme based on a flat diffraction grating and an MAES analyzer with one line of photodetectors. It has increased photometric accuracy due to cooling and temperature stabilization of the photodetector range, as well as due to its shell-less design, in which there is no re-reflection of radiation on the cover glass and the background level in the recorded spectrum decreases. The optical scheme and design of the spectrometer are optimized to obtain a high-quality spectrum with a low level of background radiation in any of the regions lying in the spectral range of 190-1100 nm. The choice of the working area is carried out by changing and rotating the diffraction gratings. The sealed case of the spectrometer is filled with an inert gas. The radiation is injected into the spectrometer using a quartz capacitor or a fiber-optic cable with an SMA-905 connector. The optical scheme and design of the spectrometer are protected by patents.

The multifunctional X-ray diffractometer DRON-8 (8H) with a vertical theta goniometer and the horizontal position of the sample allows X-ray diffraction analysis of the phase composition, structural state and orientation of a wide range of objects of various shapes and sizes.

The spectrometer is designed to perform quantitative and qualitative spectral analysis of various substances and materials (powders, metals, solutions) in factory and research laboratories. The spectrometer is compact due to the vertical arrangement of the Paschen-Runge optical system. It consists of two MAES analyzers with 10 lines of photodiodes installed on a circle with a radius of 520 mm, a non-classical concave diffraction grating, a special table with a built-in computer and a spectrum excitation source.

The X-ray diffractometer DRON–8T is the flagship model of the line of stationary X-ray diffractometers of JSC IC Burevestnik. It is equipped with a high-precision wide-angle vertical goniometer with an angular reproducibility of 0.0001° and is designed mainly for the study of highly perfect crystalline objects (single crystals, epitaxial films) in high-resolution geometry.

The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task. Designed for the analysis of almost any type of environmental samples – water, soil, precipitation. Quick switching to work. It does not require a long warm-up. Low argon consumption. Easy to use.

NanoEducator II, despite its compactness and ease of operation, supports all basic techniques of atomic force and scanning tunneling microscopy, so it can be used for any routine AFM and STM measurements and experiments in scientific research. Here are the results of some experiments in various scientific applications: Study of atomic structures Study of metallic nanostructures Study of magnetic structures Study of polymer objects Study of biological objects Study of carbon nanomaterials

A machine for the preparation of graphite electrodes Crater-2. Two types of cutters can be installed simultaneously in the machine, for example, on a crater and a cone.

The analyzer is designed to determine the mass fraction of sulfur in automotive fuel in accordance with GOST R 52660-2006 / GOST ISO 20884-2016, ASTM D6334, as well as in oil and petroleum products according to GOST R 53203-2008 / GOST 33194-2014, ASTM D2622, GB/T 11140-2008. Depending on the customer's needs, the analyzer is configured to work in accordance with a particular standard. Implements an arbitration method for measuring the mass fraction of sulfur in automobile fuel of the third, fourth and fifth classes. The device is designed specifically for high-quality and fast X-ray fluorescence analysis of fuel in accordance with the technical regulations "On requirements for automotive and aviation gasoline, diesel and marine fuel, jet fuel and heating oil", which establishes an arbitration X-ray fluorescence wave dispersion method for determining the mass fraction of sulfur in automotive fuels of the third, fourth and fifth classes. The wave dispersion sulfur analyzer SPECTROSCAN SW-D3 is designed taking into account all the requirements for the process of X-ray fluorescence elemental analysis of low sulfur contents in petroleum products. The operator's actions when performing measurements are minimized: - the number/name of the sample is entered from the built-in keyboard; - the sample is poured into two cuvettes; - the obtained samples are placed in the analyzer and measurements are started. The analyzer performs all subsequent actions automatically without operator involvement: - calculates and displays the sulfur content in the sample; - calculates convergence - the difference in determining the mass fraction of sulfur in the first and second samples; - prints measurement results on the built-in printer.

The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area. The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined. With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.

The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

The device is designed to analyze the phase composition and structural state of polycrystalline objects of various origins.

MAES analyzers for recording atomic emission spectra with a time resolution of 1 ms are based on highly sensitive photodiodes and a special switching board for simultaneous reading of several sections of the spectra. The assembly of the rulers is installed on the "Grand" spectrometer. A " Flow" or twin-jet arc plasmatron is used to excite the atomic emission spectra of powder samples. The ATOM software registers the selected spectral lines and provides their processing according to the specified algorithms, taking into account the number and brightness of flashes (i.e. particle size). Recording the spectra of powder samples with a large time resolution makes it possible to estimate the number and size of individual particles, identify their composition and determine the concentrations of elements in each particle, promptly assess the uniformity of the distribution of certain elements to be determined and expand the possibilities of spectral analysis without significant changes in sample preparation. Main application areas: mass analysis of powder geological samples by scintillation to determine gold, silver, platinum group metals, iridium, rhodium, etc. with detection limits up to 0.01 g/t; qualitative determination of the composition of inclusions and mineral particles.

Atomic Emission Complex "Grand Stream" is designed for rapid determination of the composition of powder samples of natural and industrial origin, includes a "Grand" spectrometer, a "Stream" installation and auxiliary equipment for sample preparation.