Multipurpose X-ray diffractometer DRONE-8 (8H)

The X-ray diffractometer DRON–8T is the flagship model of the line of stationary X-ray diffractometers of JSC IC Burevestnik. It is equipped with a high-precision wide-angle vertical goniometer with an angular reproducibility of 0.0001° and is designed mainly for the study of highly perfect crystalline objects (single crystals, epitaxial films) in high-resolution geometry.

The spectrometer is designed to perform quantitative and qualitative spectral analysis of various substances and materials (powders, metals, solutions) in factory and research laboratories. The spectrometer is compact due to the vertical arrangement of the Paschen-Runge optical system. It consists of two MAES analyzers with 10 lines of photodiodes installed on a circle with a radius of 520 mm, a non-classical concave diffraction grating, a special table with a built-in computer and a spectrum excitation source.

Designed for comprehensive studies of the physical properties of the surface using classical optical microscopy, confocal laser microscopy, confocal spectroscopy and scanning probe microscopy (atomic force microscopy). It allows you to get full spectra of Raman (Raman or Raman) scattering and/or fluorescence, confocal laser and confocal spectral images (surface mapping), SPM (AFM) images. The design of the Centaur I complex allows the use of both separate methods (for example, confocal microscopy / spectroscopy) and the combination of methods (including the combination of scanning fields, AFM / Raman studies, etc.).

The spectrometer is designed to determine the contents of elements in the range from Na to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the X-ray spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements to be determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element to be determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the X-ray fluorescence spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

A machine for the preparation of graphite electrodes Crater-2. Two types of cutters can be installed simultaneously in the machine, for example, on a crater and a cone.

Atomic Emission Complex "Grand Stream" is designed for rapid determination of the composition of powder samples of natural and industrial origin, includes a "Grand" spectrometer, a "Stream" installation and auxiliary equipment for sample preparation.

MAES analyzers for recording atomic emission spectra with a time resolution of 1 ms are based on highly sensitive photodiodes and a special switching board for simultaneous reading of several sections of the spectra. The assembly of the rulers is installed on the "Grand" spectrometer. A " Flow" or twin-jet arc plasmatron is used to excite the atomic emission spectra of powder samples. The ATOM software registers the selected spectral lines and provides their processing according to the specified algorithms, taking into account the number and brightness of flashes (i.e. particle size). Recording the spectra of powder samples with a large time resolution makes it possible to estimate the number and size of individual particles, identify their composition and determine the concentrations of elements in each particle, promptly assess the uniformity of the distribution of certain elements to be determined and expand the possibilities of spectral analysis without significant changes in sample preparation. Main application areas: mass analysis of powder geological samples by scintillation to determine gold, silver, platinum group metals, iridium, rhodium, etc. with detection limits up to 0.01 g/t; qualitative determination of the composition of inclusions and mineral particles.

The X-ray fluorescence spectrometer SPECTROSCAN MAX-GF1(2)E-C combines two methods of detecting an analytical signal: diffraction on a crystal (wave dispersion - WDX) and energy dispersion (EDX) method, as well as sample delivery adapted for the analysis of large-size images. The collimation of the primary radiation of the X-ray tube and the special design of the sample presentation make it possible to analyze the sample over an area of 1 cm2 in 1 mm increments, and thus investigate the distribution of elements over an area. The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. With the help of fixed energy dispersion channels, any one or two additional elements in the range from magnesium (Mg) to calcium (Ca) can be determined. With the help of this modification of the spectrometer, forensic and customs examinations, judicial and forensic medical examinations, as well as art-historical examinations are carried out.

The analyzer is designed to determine the mass fraction of sulfur in automotive fuel in accordance with GOST R 52660-2006 / GOST ISO 20884-2016, ASTM D6334, as well as in oil and petroleum products according to GOST R 53203-2008 / GOST 33194-2014, ASTM D2622, GB/T 11140-2008. Depending on the customer's needs, the analyzer is configured to work in accordance with a particular standard. Implements an arbitration method for measuring the mass fraction of sulfur in automobile fuel of the third, fourth and fifth classes. The device is designed specifically for high-quality and fast X-ray fluorescence analysis of fuel in accordance with the technical regulations "On requirements for automotive and aviation gasoline, diesel and marine fuel, jet fuel and heating oil", which establishes an arbitration X-ray fluorescence wave dispersion method for determining the mass fraction of sulfur in automotive fuels of the third, fourth and fifth classes. The wave dispersion sulfur analyzer SPECTROSCAN SW-D3 is designed taking into account all the requirements for the process of X-ray fluorescence elemental analysis of low sulfur contents in petroleum products. The operator's actions when performing measurements are minimized: - the number/name of the sample is entered from the built-in keyboard; - the sample is poured into two cuvettes; - the obtained samples are placed in the analyzer and measurements are started. The analyzer performs all subsequent actions automatically without operator involvement: - calculates and displays the sulfur content in the sample; - calculates convergence - the difference in determining the mass fraction of sulfur in the first and second samples; - prints measurement results on the built-in printer.

Vacuum spectrometers are designed for rapid analysis of alloys based on iron, copper, aluminum and other metals in factory and research laboratories, including the determination of elements having analytical lines in the field of vacuum ultraviolet (VUV) (for example, S, P and C in steels).

The spectrometer is designed to measure the intensities of analytical lines of chemical elements and, by recalculating them, determine the mass concentration of elements from P(15) to U(92) contained in the analyzed sample. The process of analysis from a set of data and their processing to obtaining results in the form of a table of concentrations of the elements being determined is automated and performed using a personal computer. The spectrometer can be used in various fields of science and technology (ecology, biology, medicine, agriculture, food industry, geology, mining, geophysics, sanitary and epidemiological control, etc.).

The device is designed to analyze the phase composition and structural state of polycrystalline objects of various origins.

Atomic Emission Complex "Grand Globula" includes a spectrometer "Grand", a spectroanalytic generator "Ball Lightning" and a tripod "Globula". It allows the analysis of various substances and materials in arc and spark discharges in air, for example according to GOST 17818.15-90 "Graphite. Spectral analysis method", GOST 9717.1-82 "Copper. A method of spectral analysis based on metallic standard samples with photoelectric spectrum registration" and other MVIS.

NanoEducator II, despite its compactness and ease of operation, supports all basic techniques of atomic force and scanning tunneling microscopy, so it can be used for any routine AFM and STM measurements and experiments in scientific research. Here are the results of some experiments in various scientific applications: Study of atomic structures Study of metallic nanostructures Study of magnetic structures Study of polymer objects Study of biological objects Study of carbon nanomaterials

The dual-view plasma spectrometer can record any spectral line simultaneously at high resolution in the concentration range from fractions of ppb up to tens of percent and offers a wide range of options for any research task. Designed for the analysis of almost any type of environmental samples – water, soil, precipitation. Quick switching to work. It does not require a long warm-up. Low argon consumption. Easy to use.