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IPPP-1 Semiconductor Device Parameter Meters

Technical specifications:

4-channel automated system for measuring the parameters of semiconductors (including test structures on plates)
Study of the VAC of 2, 3, 4-pole
Parameters of each channel Source/meter:- U: ±2 V, ±30 V (200 mA),
±120 V (±10 mA), I: ±20, ±200 nA, ±2, ±20, ±200 Ma, ±2, ±10mA, (±120V), ±20,
±200 mA (±30V)
Source and meter error U, I ± 0.5%
Sensitivity of the U/I meter: 10 mv/ 0.1 pA
Graphs, tables, texts, databases
RS-232C interface, computer software
Dimensions, weight: 450x266x444 mm, 23 kg
Power supply: ~220V, 120 VA