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60 products
Two-pulse laser source of excitation of atomic emission spectra
Two-pulse laser source of excitation of atomic emission spectra
The laser source is designed to excite atomic emission spectra when performing qualitative spectral analysis of hard rocks - metals, minerals, glasses and others. The source is based on a two-pulse YAG: Nd laser with electro-optic Q-switching operating at the main wavelength of 1064 nm. The duration of each pulse is no more than 10 ns, and the delay between them is adjustable from 0 to 60 microseconds. The possibility of the laser beam to focus on an area of 300 to 1000 microns makes it possible to conduct microanalysis of inclusions, perform two-dimensional scanning of the surface or locally analyze samples with virtually no damage to the surface. A significant advantage of the laser source is the expressiveness and lack of special sample preparation for a wide range of conductive and non-conductive materials. Visual observation and pointing of the beam at the sample is carried out using a stereoscopic microscope integrated into the system, as well as a high-resolution digital video camera with image transmission to a computer. Moving the instrument table with a fixed sample is possible both manually for adjustment, and with the help of stepper motors in two coordinates during analysis, which provides surface scanning and spectrum recording with reference to the video image. The installation can be used in conjunction with any spectral devices – "Grand", "Aspect", "Express", "Hummingbird-2", STE-1, DFS-458, MFS-8, PGS-2 and others. The laser source is designed to excite atomic emission spectra when performing high-quality spectral analysis of hard rocks – metals, minerals, glasses and others.
Produced in: Novosibirsk
Mini press for producing thin layers of substance on steel mirror plates
Mini press for producing thin layers of substance on steel mirror plates
It is intended for sample preparation when examining samples using an IR microscope and mirror reflection prefixes. Allows you to shape a thin layer (up to several microns) to various objects: polymer fragments, microparticles of LCP, powdery substances, fibers, etc. The resulting thin layers on mirror plates made of alloy steel are investigated by the double transmission method – when the radiation that has passed through the layer of matter is reflected from the surface of the plate and passes through the substance again. The spectra recorded by this method are completely identical to the transmission spectra obtained, for example, after pressing substances with KBr. The advantages in this case are: - speed of sample preparation - there is no need to use hydraulic and manual presses and molds, grinding mortars, etc. - no need to use high-purity KBr or petroleum jelly oil - the sample is not lost and, if necessary, can be examined by other methods - when using an IR microscope, it is possible to “scan” the resulting thin layer to select the most informative area, and also, if the layer is heterogeneous in composition, to obtain the spectral characteristics of its components.
SIMEKS
Novosibirsk
Produced in: Novosibirsk
Spectral measuring complex: automated IR Fourier spectrometer "FT-801" with IR microscope "MIKRAN-2"
Spectral measuring complex: automated IR Fourier spectrometer "FT-801" with IR microscope "MIKRAN-2"
2 supp.
from 100 500 ₽
The wide-range IR microscope of the MICRAN series, connected to the FT-801 and Infralum FT-801 Fourier spectrometers, is designed to study samples from 10 microns in size, including heterogeneous in composition. When working on an IR microscope, the operator has the opportunity to observe the object under study with a magnification of over 200X both using binoculars and on a monitor using a digital video camera, during photometry, select a local area of arbitrary shape with the help of diaphragms, and also “scan” the surface of the sample, observing the spectrum obtained in real time.
SIMEKS
Novosibirsk
Produced in: Novosibirsk
Focusing prefix MKF-Yu
Focusing prefix MKF-Yu
It allows recording transmission spectra of objects with sizes from 500 microns (precious stones, optical parts, semiconductor materials). It is also used in the study of samples compressed into small-diameter tablets with KBr (the method is convenient for spectral analysis of powdery substances - the prefix allows you to work with small amounts of the sample using a manual press for the manufacture of tablets). • The diameter of the focus spot is less than 3 mm • The design uses parabolic mirror optics • The set-top box is equipped with a set of replaceable diaphragm holders for samples of different sizes • Windows-substrates made of IR-transparent materials can be placed in the holder after pasty, liquid substances or extracts are applied to them, followed by drying of the layers • The slide table has the possibility of smooth movement in vertical and horizontal directions to achieve the maximum signal level
SIMEKS
Novosibirsk
Produced in: Novosibirsk
Device for preparation of metal samples
Device for preparation of metal samples
A device for preparing metal samples for spectral analysis. For the preparation of metal samples, an emery cloth or paper with a given size and abrasive material is used. The rotation speed is 1500 revolutions per minute. A quick stop of the motor is provided by an automatic control unit. There is a version in a housing made of composite materials with two discs, each can have its own type of abrasive.
Produced in: Novosibirsk
Remote-controlled atomizer
Remote-controlled atomizer
A remote-controlled atomizer of powder samples with automatic change of revolver-type samples with arc excitation of the spectrum. It consists of an automatic tripod "Carousel" for arc spectral analysis and a spectroanalytic generator "Ball Lightning"– 40A fully compatible with the expert software system "ATOM" and the MAES analyzer.
Produced in: Novosibirsk
FT-801 IR Fourier spectrometer
FT-801 IR Fourier spectrometer
It is designed for recording absorption spectra of solid, liquid and gaseous substances in the near and middle IR region (including drugs, lacquers and paints, petroleum products, explosives, pharmacological preparations, polymer films and fibers) with their subsequent identification, as well as for qualitative and quantitative analysis of mixtures containing several components.
SIMEKS
Novosibirsk
Produced in: Novosibirsk
Liquid flask with adjustable thickness of the test liquid layer
Liquid flask with adjustable thickness of the test liquid layer
A liquid flask with an adjustable layer thickness of the liquid under study is made in the form of an optical-mechanical attachment installed in the cuvette compartment of the FT-801 spectrometer. It contains focusing optics, removable holders of two windows-substrates with a diameter of 10 mm and two adjusting screws placed on the upper panel of the console housing and designed to set the required gap between the windows. A liquid of any degree of viscosity is pre-applied in the form of a small drop to the lower window and then, in the process of smooth convergence of the windows, evenly fills the gap between them. By rotating the adjusting screws and observing the transmission spectrum online, the user has the opportunity to set the desired thickness of the liquid layer, guided by the overall intensity of the entire spectrum or by the intensity of specific absorption bands. In the presence of calibration, which is easy to create using the ZaIR 3.5 program for several samples with a known concentration, the cuvette allows quantitative measurements. The flask is indispensable in the analysis of mixtures containing impurities in small proportions. Technical specifications Transmission in the operating range of the spectrum, % of the input signal at least 50 The recommended number of scans when registering spectra is 16 Time of spectrum registration at 16 scans (resolution 4 cm-1), sec 20 Minimum volume of the studied liquid, mm3 1 The diameter of the focus spot, mm 3 Overall dimensions, mm 200×90×160 Weight, kg 1,1 The figure shows several spectra of the viscous lubricant "Buxol", illustrating the process of selecting the thickness of the sample layer between the windows. The measurement process has a high expressiveness and reproducibility, inexpensive replaceable substrate windows are used, the system is easy to configure and clean, a very small amount of sample is required to obtain high-quality spectra.
SIMEKS
Novosibirsk
Produced in: Novosibirsk
MNPVO prefix with a zinc selenide element and an integrated visualization system on an external monitor
MNPVO prefix with a zinc selenide element and an integrated visualization system on an external monitor
The main difference between this set-top box and the universal set-top box of the NPVO and ZDO is that a prism is used as a working element of the MNPVO, which allows to obtain several reflections from the area of contact with the sample under study, which leads to an improvement in the quality of the spectrum and an increase in the sensitivity of the method (absorption bands become more pronounced). The registration of specular and diffuse reflection spectra (ZDO) is not provided on this set-top box. The MNPVO prefix is effective in registering the absorption spectra of samples whose dimensions (number) are sufficient to ensure contact with the entire area of the working face of the prism: * liquids of any degree of viscosity (solutions, suspensions, oils, etc.); * solid elastic samples (polymer fragments of sufficiently large size, rubbers, plastics, etc.); * powdered samples in quantities sufficient to be applied to the entire surface and samples in the form of thin tapes; The universal clamp is equipped with a precision lever mechanism for quickly lowering the tip and a micrometer screw that allows you to pre–set the optimal degree of pressure - this ensures quick sample change and repeatability of the results during measurements. For convenience when working with liquid and paste-like samples, it is possible to rotate the clamping console by 180o. Note: the MNPVO prefix does not exclude the possibility of registering the spectra of samples whose dimensions are smaller than the area of the working face of the prism (the presence of a visual inspection system of the surface under study increases convenience when working with small-sized objects), but the overall effectiveness of the method is significantly lower than when using the universal NPVO and ZDO prefix. Transmission in the operating range of the spectrum, % of the input signal of at least 25 · The recommended number of scans when registering spectra is 25 · Spectrum registration time at 25 scans (resolution 4 cm-1), 30 seconds · The depth of penetration of radiation into the sample, microns 5 – 15 · Minimum area of a solid sample, mm2 1 · Minimum volume of the test liquid, ml 0.3 · The permissible pH range of the analyzed objects is from 5 to 9 · Crystal substrate material ZnSe CVD, Ge · Diameter of the focus spot, mm 3 · Number of reflections 3 · The size of the working face of the prism, mm 21 X 6 · Magnification of the 4X micro lens · Total magnification of the visual channel 75X · Field of view of the optical system, mm 2 X 2.5 · Digital video camera resolution 640 X 480 · Overall dimensions, mm 145×125×240 · Weight, kg 2
SIMEKS
Novosibirsk
Produced in: Novosibirsk
Reflection prefix PO-15 V
Reflection prefix PO-15 V
Designed for the study of various types of solid samples, including optical and semiconductor materials, precious stones and other objects of arbitrary shape • The sample is located on the subject plane of the investigated surface downwards, the angle of incidence of the central beam on the sample is 15 ° • Allows you to examine samples of small sizes (the diameter of the test area is from 1 mm) • The set-top box is equipped with a set of replaceable diaphragm holders for samples of different sizes • When using a mini-press, it allows you to examine samples in the form of a thin layer rolled out on a mirror plate made of alloy steel (radiation passes through the substance layer twice, reflecting from the mirror surface) • Not used: for the study of bulk and liquid substances
SIMEKS
Novosibirsk
Produced in: Novosibirsk
Steam generator of analytical samples of metal samples "Aspect"
Steam generator of analytical samples of metal samples "Aspect"
During operation, the steam generator of metal samples "Aspect" provides control of all devices of the atomic emission spectral analysis complex - the MAES analyzer, the Ball Lightning generator, the inclusion of external devices; A spark unipolar discharge is excited between a tungsten counterelectrode and the surface of the test samples - ingots of precious metals or other metal samples; The intensity of erosion of the sample surface is regulated by changing the repetition frequency and power of spark pulses generated by a computer-controlled semiconductor spark generator; The stability and quality of the frisking is monitored using a built-in spectrometer via optical fiber; An adjustable flow of high-purity argon passes through the spark discharge zone in a sealed discharge chamber, picks up sample particles obtained by spark erosion of the surface and transfers them in the form of an aerosol to the area of the mixer/sprayer of the inductively coupled plasma torch of the optical emission spectrometer.; The flow of high-purity argon is supplied, controlled and regulated by a microprocessor-controlled mass flow controller in the range from 0.5 to 3 l/min. Feed stability 0.01 l/min.
Produced in: Novosibirsk
Nephelometer OptiCounter
Nephelometer OptiCounter
The OptiCounter laser nephelometer is a device for detecting particles in a suspension, assessing the turbidity of a liquid, and the concentration of microorganisms. The device has an innovative optical circuit with an increased optical path length (4 cm) and 8 scattered light sensors. This makes it possible to measure both the light scattered at an angle of 90° (which is prescribed in the standards for determining turbidity EN ISO 7027 and GOST 57164-2016) and the optical density of the sample. The device is designed specifically for working with vials for T25 cell cultures. Thus, the OptiCounter nephelometer allows you to obtain reliable data both in the case of highly scattering media (for example, a suspension of bacteria) and in the case of small impurities of scattering particles, including a monolayer of cells. The OptiCounter nephelometer simplifies the monitoring of cell culture growth. The device is equipped with a wireless Bluetooth module and is capable of autonomous operation directly in the CO2 incubator. Automated software will allow you to receive data on the growth of culture in remote access mode.
Produced in: Novosibirsk