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Automated device for measuring the content of toxic trace elements (As, Cd, Pb, Cu, Zn, Mn, Hg, Se, I, Ni, Co, Fe, Ag, Sb, Bi, Fe, Sn) in water, soil, food products by voltammetric methods with sensitivity at 1/10 of the permissible level (MPC) and below.

The spectrometer was created according to the Cherni-Turner scheme based on a flat diffraction grating and an MAES analyzer with one line of photodetectors. It has increased photometric accuracy due to cooling and temperature stabilization of the photodetector range, as well as due to its shell-less design, in which there is no re-reflection of radiation on the cover glass and the background level in the recorded spectrum decreases. The optical scheme and design of the spectrometer are optimized to obtain a high-quality spectrum with a low level of background radiation in any of the regions lying in the spectral range of 190-1100 nm. The choice of the working area is carried out by changing and rotating the diffraction gratings. The sealed case of the spectrometer is filled with an inert gas. The radiation is injected into the spectrometer using a quartz capacitor or a fiber-optic cable with an SMA-905 connector. The optical scheme and design of the spectrometer are protected by patents.

The spectrometer is designed to determine the contents of elements in the range from Ca to U in substances in solid, powdery, dissolved states, as well as deposited on the surface or deposited on filters. The principle of operation of the spectrometer is based on irradiation of the sample with primary radiation from an X-ray tube, measurement of the intensity of secondary fluorescent radiation from the sample at wavelengths corresponding to the elements being determined, and subsequent calculation of the mass fraction of these elements according to a pre-constructed calibration characteristic, which is the dependence of the content of the element being determined on the measured intensity. Secondary fluorescent radiation is decomposed into a spectrum using a crystal analyzer. Due to this, the spectrometer has a high resolution, and therefore the ability to accurately analyze complex multicomponent substances.

High-precision measurements of hydrogen concentration in the range of 95-100% Monitoring of the operation of electrolyzers, control of hydrogen purity in the processes of hydrogen cooling of generators, in the technological processes of chemical, petrochemical, metallurgical and other industries 24 months warranty for deliveries across the Russian Federation A new patented measurement method The device does not require calibration Selectivity of measurement Direct method of measuring molecular hydrogen Insensitivity to humidity, carbon dioxide, oil vapor Measurement time 3-5 min Simple, intuitive interface Minimum maintenance Self-diagnosis Routine maintenance no more than 1 time per year Long-lasting, highly stable sensor The service life of the sensor is at least 10 years Color touch screen

NT-MDT Spectrum Instruments is an INTEGRA Nano IR–scattering scanning near‑field optical microscope (s-NSOM) designed for the infrared spectral range. The AFM probe is located in the focus of an optical system that directs the IR laser radiation to the sample and collects the optical response. The collected radiation is sent to the Michelson interferometer for optical analysis. The far-field component of the collected signal is suppressed by synchronous detection. The INTEGRA Nano IR system allows detecting the amplitude and phase of the near-field signal. The spatial resolution of the resulting reflection and absorption contrasts is approximately 10 nm and is determined only by the size of the tip of the probe.

Technical specifications: Melt flow rate for 10 min, g 0.1 - 99.9 The dimensions of the capillary opening, mm dia. 2,095 diam. 1,048 (optional) diam. 1,180 (optional) Set of loads, kg 0,325-5 10-21,6 (optional) Temperature range in the working chamber, °C +50...+450 Accuracy of temperature maintenance, °C: - in the range of 50...300 °C: ± 0.1 - in the range of 300...350 ° C: ± 0.2 - in the range of 350...450°C: ±0.3 The discreteness of setting the temperature of the chamber, ° C 1 Time to enter the operating mode, no more, min 40 Power supply, V/kW 220/0.8 Installation dimensions, WxDxH mm 513x445x590 (920 is the maximum height with a fully loaded polymer chamber and a full stack of loads with a handle for their installation) Installation weight, not more than 70 kg

Bottles are used to protect the basic properties of chemical, pharmaceutical and other liquid, paste-like, mixed fluid products. Designed for scientific research. Not intended for medical use. Bottle: low density polyethylene (LDPE). Cover: polypropylene (polypropylene copolymers). The addition of a nucleator (illuminator) is allowed for greater hardness (if necessary).

14 high-precision stepper motors control all moving parts of the microscope, and intelligent software blurs the line between optical and SPM imaging. NEXT provides continuous magnification from millimeter-scale panoramic optical images to atomic resolution, and intermediate operations such as laser pointing to the cantilever, sample positioning, soft approach and configuration of advanced SPM techniques occur automatically.

The X-ray diffractometer DRON–8T is the flagship model of the line of stationary X-ray diffractometers of JSC IC Burevestnik. It is equipped with a high-precision wide-angle vertical goniometer with an angular reproducibility of 0.0001° and is designed mainly for the study of highly perfect crystalline objects (single crystals, epitaxial films) in high-resolution geometry.

The laser source is designed to excite atomic emission spectra when performing qualitative spectral analysis of hard rocks - metals, minerals, glasses and others. The source is based on a two-pulse YAG: Nd laser with electro-optic Q-switching operating at the main wavelength of 1064 nm. The duration of each pulse is no more than 10 ns, and the delay between them is adjustable from 0 to 60 microseconds. The possibility of the laser beam to focus on an area of 300 to 1000 microns makes it possible to conduct microanalysis of inclusions, perform two-dimensional scanning of the surface or locally analyze samples with virtually no damage to the surface. A significant advantage of the laser source is the expressiveness and lack of special sample preparation for a wide range of conductive and non-conductive materials. Visual observation and pointing of the beam at the sample is carried out using a stereoscopic microscope integrated into the system, as well as a high-resolution digital video camera with image transmission to a computer. Moving the instrument table with a fixed sample is possible both manually for adjustment, and with the help of stepper motors in two coordinates during analysis, which provides surface scanning and spectrum recording with reference to the video image. The installation can be used in conjunction with any spectral devices – "Grand", "Aspect", "Express", "Hummingbird-2", STE-1, DFS-458, MFS-8, PGS-2 and others. The laser source is designed to excite atomic emission spectra when performing high-quality spectral analysis of hard rocks – metals, minerals, glasses and others.

The sulfur analyzer ASV-2 is designed to measure the mass fraction of sulfur in gasoline (unleaded), diesel fuel, oil, kerosene, oil residues, lubricating oil bases, hydraulic oils, jet fuels, crude oil and other distillate oil products. The ASV-2 analyzer allows to perform the functions of determining sulfur both in the vacuum mode of the measuring chamber and in the helium purge mode. For this purpose the device is equipped with a set of accessories for connection of the analyzer to the helium post.