Scanning probe microscope SMM-2000
Viewing and measuring grains and defects in the structure of materials, resolution to atoms (Nobel Prize in 1986), replacement of metal-graphic and electron microscopes
Increase: from x2 thousand to x10 million.
Measuring range: 0.2 nm to 30 microns
All basic (STM, contact and vibro-AFM) modes, and more than 25 extras.modes
Produced in: Moscow, Zelenograd