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Scanning probe microscope SMM-2000
Scanning probe microscope SMM-2000
Viewing and measuring grains and defects in the structure of materials, resolution to atoms (Nobel Prize in 1986), replacement of metal-graphic and electron microscopes Increase: from x2 thousand to x10 million. Measuring range: 0.2 nm to 30 microns All basic (STM, contact and vibro-AFM) modes, and more than 25 extras.modes
Produced in: Moscow, Zelenograd