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Viewing and measuring grains and defects in the structure of materials, resolution to atoms (Nobel Prize in 1986), replacement of metal-graphic and electron microscopes Increase: from x2 thousand to x10 million. Measuring range: 0.2 nm to 30 microns All basic (STM, contact and vibro-AFM) modes, and more than 25 extras.modes

Scanning Probe Microscopy In air and in liquid: AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy/ Phase Mapping/ Force Modulation/ Adhesive Force Mapping/ Lithographs: AFM (Power) Only in air: STM/MSM/ESM/SEM/ Kelvin Probe Method/ Display of Spreading Resistance/ AFAM (on demand)/Lithographs: AFM (Current), STM/.