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Scanning Probe Microscopy In air and in liquid: AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy/ Phase Mapping/ Force Modulation/ Adhesive Force Mapping/ Lithographs: AFM (Power) Only in air: STM/MSM/ESM/SEM/ Kelvin Probe Method/ Display of Spreading Resistance/ AFAM (on demand)/Lithographs: AFM (Current), STM/.

Viewing and measuring grains and defects in the structure of materials, resolution to atoms (Nobel Prize in 1986), replacement of metal-graphic and electron microscopes Increase: from x2 thousand to x10 million. Measuring range: 0.2 nm to 30 microns All basic (STM, contact and vibro-AFM) modes, and more than 25 extras.modes

Measurement of roughness parameters Ra; Rz; Rmax; Rp; Rv; Rq; Sm; S; la; lq; tp; Lo; D; da; dq, etc., viewing the profilogram and measuring the size of inhomogeneities Tracing length: 0.5mm – 40 mm Measurement range according to Ra: 0.012 – 50mkm Degree of accuracy 1 (error 2%) Work inside the vestibule > 3mm

Technical specifications: Method of ionization Plasma pulsed glow discharge Discharge gas Argon, consumption less than 1 l/hour Time-of-flight Mass Analyzer with mesh-free ion mirror Resolution 4000 The number of simultaneously defined components is unlimited Mass range 1-1000 m/z Detection limits 1-100 ppb Layer-by-layer resolution Up to 5 nm Depth of analysis Up to 30 microns The time for one analysis of a solid sample is 30 minutes (with the option of a revolver system – 3-5 minutes) Vacuum system 1 Booster pump and 2 TMN (240 l/sec) Overall dimensions 1450×780×1550 mm