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NanoEducator II, despite its compactness and ease of operation, supports all basic techniques of atomic force and scanning tunneling microscopy, so it can be used for any routine AFM and STM measurements and experiments in scientific research. Here are the results of some experiments in various scientific applications: Study of atomic structures Study of metallic nanostructures Study of magnetic structures Study of polymer objects Study of biological objects Study of carbon nanomaterials

The ultimate display quality is ensured by the use of built-in acoustic and vibration isolation, thermal stabilization, the industry's best sensitivity of the optical recording system and the unique design of the scanning probe system, which allows achieving atomic resolution in routine measurements. In the basic configuration, 50+ AFM techniques are available, including the HybriD method, which allows conducting all cutting-edge nanomechanical, electrical and magnetic studies. Intelligent ScanTronic™ algorithm for one-click optimization of scanning parameters, which allows for perfect relief measurements using the amplitude-modulation method, regardless of the operator's experience. Automated examination of multiple samples using a simple user interface to create a point-by-point scanning scenario and a database for stored received images. Control of samples with dimensions up to 200×200 mm and thickness up to 40 mm at any point of the surface with a positioning accuracy of 1 micron. Wide customization possibilities: installation of additional optical equipment, development of specialized sample holders, combination with a transport system, automation of measurements and data analysis in accordance with customer requirements.

NT-MDT Spectrum Instruments is an INTEGRA Nano IR–scattering scanning near‑field optical microscope (s-NSOM) designed for the infrared spectral range. The AFM probe is located in the focus of an optical system that directs the IR laser radiation to the sample and collects the optical response. The collected radiation is sent to the Michelson interferometer for optical analysis. The far-field component of the collected signal is suppressed by synchronous detection. The INTEGRA Nano IR system allows detecting the amplitude and phase of the near-field signal. The spatial resolution of the resulting reflection and absorption contrasts is approximately 10 nm and is determined only by the size of the tip of the probe.

NTEGRA Spectra II is already a second-generation measuring system that successfully demonstrates the unification of two worlds: AFM and Raman spectroscopy. It can perform multiple functions ranging from relief mapping to 2D spectral analysis, from studies of electrical and mechanical properties to optical measurements with a resolution below the diffraction limit. Now scientists can conduct a complete physico-chemical analysis of the surface properties of the sample at a time. As a result, researchers get unlimited opportunities to develop their laboratory techniques.

Designed for comprehensive studies of the physical properties of the surface using classical optical microscopy, confocal laser microscopy, confocal spectroscopy and scanning probe microscopy (atomic force microscopy). It allows you to get full spectra of Raman (Raman or Raman) scattering and/or fluorescence, confocal laser and confocal spectral images (surface mapping), SPM (AFM) images. The design of the Centaur I complex allows the use of both separate methods (for example, confocal microscopy / spectroscopy) and the combination of methods (including the combination of scanning fields, AFM / Raman studies, etc.).

14 high-precision stepper motors control all moving parts of the microscope, and intelligent software blurs the line between optical and SPM imaging. NEXT provides continuous magnification from millimeter-scale panoramic optical images to atomic resolution, and intermediate operations such as laser pointing to the cantilever, sample positioning, soft approach and configuration of advanced SPM techniques occur automatically.

NT-MDT S.I. presents NTEGRA II, the second generation of the world's most popular AFM. Thanks to additional features and advanced functions, it provides an unprecedented level of modularity and flexibility, becoming a true partner of the researcher. Intelligent, fast, reliable, accurate and undoubtedly easy to use. To eliminate the influence of a noisy environment, the NTEGRA II is supplied in a standard cabinet that provides temperature control, acoustic and vibration isolation. This combination reveals the true nature of NTEGRA II as the most stable AFM in the world, providing a temperature drift of less than 0.2 nm/min.

Scanning Probe Microscopy In air and in liquid: AFM (contact + semi-contact + non-contact) / Lateral Force Microscopy/ Phase Mapping/ Force Modulation/ Adhesive Force Mapping/ Lithographs: AFM (Power) Only in air: STM/MSM/ESM/SEM/ Kelvin Probe Method/ Display of Spreading Resistance/ AFAM (on demand)/Lithographs: AFM (Current), STM/.